中華人民共和國國家標準(中國大陸GB標準)英文版 |
GB標準是中華人民共和國國家標準,也叫GB國標,是中國大陸強制執行的國家標準,所有中國大陸境內銷售的商品及提供服務都必須符合GB國家標準的要求,包括進口商品及服務; 本網站提供GB國家標準的查詢檢索,英文版翻譯,GB標準產品檢測檢驗及合規性分析服務; |
GB/T 26069-2022 硅单晶退火片(中英文版) Annealed monocrystalline silicon wafers |
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GB/T 25076-2018 太阳能电池用硅单晶(中英文版) Monocrystalline silicon for solar cell |
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GB/T 12965-2018 硅单晶切割片和研磨片(中英文版) Monocrystalline silicon as cut wafers and lapped wafers |
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GB/T 12964-2018 硅单晶抛光片(中英文版) Monocrystalline silicon polished wafers |
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GB/T 26071-2018 太阳能电池用硅单晶片(中英文版) Monocrystalline silicon wafers for solar cells |
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GB/T 32278-2015 碳化硅单晶片平整度测试方法(中英文版) Test methods for flatness of monocrystalline silicon carbide wafers |
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GB/T 12962-2015 硅单晶(中英文版) Monocrystalline silicon |
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SJ/T 11500-2015 碳化硅单晶晶向的测试方法(中英文版) Test method for measuring crystallographic orientation of monocrystalline silicon carbide |
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SJ/T 11501-2015 碳化硅单晶晶型的测试方法(中英文版) Test method for determining crystal type of monocrystalline silicon carbide |
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SJ/T 11502-2015 碳化硅单晶抛光片规范(中英文版) Specification for polished monocrystalline silicon carbide wafers |
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SJ/T 11504-2015 碳化硅单晶抛光片表面质量的测试方法(中英文版) Test method for measuring surface quality of polished monocrystalline silicon carbide |
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SJ/T 11503-2015 碳化硅单晶抛光片表面粗糙度的测试方法(中英文版) Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers |
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SJ/T 11499-2015 碳化硅单晶电学性能的测试方法(中英文版) Test method for measuring electrical properties of monocrystalline silicon carbide |
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GB/T 30656-2014 碳化硅单晶抛光片(中英文版) Polished monocrystalline silicon carbide wafers |
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GB/T 31351-2014 碳化硅单晶抛光片微管密度无损检测方法(中英文版) Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers |
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GB/T 30866-2014 碳化硅单晶片直径测试方法(中英文版) Test method for measuring diameter of monocrystalline silicon carbide wafers |
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GB/T 30868-2014 碳化硅单晶片微管密度的测定 化学腐蚀法(中英文版) Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching |
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GB/T 30867-2014 碳化硅单晶片厚度和总厚度变化测试方法(中英文版) Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers |
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GB/T 29508-2013 300mm 硅单晶切割片和磨削片(中英文版) 300mm monocrystalline silicon as cut slices and grinded slices |
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GB/T 29506-2013 300mm 硅单晶抛光片(中英文版) 300mm polished monocrystalline silicon wafers |
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